Assignee
MOLLAT MARTIN B
US·2 granted patents·4 citations·filing 2009–2011
Top patents by PatentIndex Score
2 records- 0160US8436635B2Semiconductor wafer having test modules including pin matrix selectable test devicesMOLLAT MARTIN B·Filed 2009·Granted May 7, 2013·4 cites·10 claims
- 0246US8174077B2High-voltage variable breakdown voltage (BV) diode for electrostatic discharge (ESD) applicationsMOLLAT MARTIN B·Filed 2011·Granted May 8, 2012·0 cites·10 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →