Assignee
MULTITEST ELEKTRONISCHE SYST
DE·19 granted patents·6 pending applications·171 citations·filing 1985–2014
Top patents by PatentIndex Score
25 records- 0190US7618074B2Handling apparatus for passing electronic components, in particular ICs, to a testing apparatusMULTITEST ELEKTRONISCHE SYST·Filed 2005·Granted Nov 17, 2009·53 cites·7 claims
- 0280US8794613B2Device and method for aligning and holding a plurality of singulated semiconductor components in receiving pockets of a terminal carrierMULTITEST ELEKTRONISCHE SYST·Filed 2013·Granted Aug 5, 2014·3 cites·19 claims
- 0374US7683608B2Handler comprising an acceleration device for testing electronic componentsMULTITEST ELEKTRONISCHE SYST·Filed 2007·Granted Mar 23, 2010·7 cites·13 claims
- 0467US7841071B2Position-correction device for correcting the position of a component holder for electronic componentsMULTITEST ELEKTRONISCHE SYST·Filed 2005·Granted Nov 30, 2010·7 cites·11 claims
- 0566US4908126AApparatus for testing and sorting electronic components, in particular IC'sMULTITEST ELEKTRONISCHE SYST·Filed 1987·Granted Mar 13, 1990·27 cites·15 claims
- 0665US7633304B2Device for testing electronic components, in particular ICs, having a sealing board arranged inside a pressure test chamberMULTITEST ELEKTRONISCHE SYST·Filed 2008·Granted Dec 15, 2009·5 cites·4 claims
- 0760US6870362B2Docking apparatusMULTITEST ELEKTRONISCHE SYST·Filed 2003·Granted Mar 22, 2005·10 cites·11 claims
- 0859US9014841B2Device and method for removing tested semiconductor componentsMULTITEST ELEKTRONISCHE SYST·Filed 2013·Granted Apr 21, 2015·1 cites·20 claims
- 0959US4703858AApparatus for testing and sorting oblong, electronic components, more particularly integrated chipsMULTITEST ELEKTRONISCHE SYST·Filed 1986·Granted Nov 3, 1987·19 cites·5 claims
- 1058US2010206768A1Device and method for aligning and holding a plurality of singulated semiconductor components in receiving pockets of a terminal carrierMULTITEST ELEKTRONISCHE SYST·Filed 2009·Application pending·0 cites
- 1154US7581410B2Low temperature testing device for electronic componentsMULTITEST ELEKTRONISCHE SYST·Filed 2005·Granted Sep 1, 2009·1 cites·12 claims
- 1254US4889242ADevice for testing and sorting electronic components, more particularly integrated circuit chipsMULTITEST ELEKTRONISCHE SYST·Filed 1986·Granted Dec 26, 1989·15 cites·17 claims
- 1350US9035669B2Apparatus and method for testing electronic devicesMULTITEST ELEKTRONISCHE SYST·Filed 2013·Granted May 19, 2015·1 cites·9 claims
- 1449US9255965B2System for post-processsing of electronic componentsMULTITEST ELEKTRONISCHE SYST·Filed 2014·Granted Feb 9, 2016·0 cites·2 claims
- 1546US4993588AApparatus for separating objects of the same kind, in particular electronic components such as integrated circuitsMULTITEST ELEKTRONISCHE SYST·Filed 1989·Granted Feb 19, 1991·12 cites·12 claims
- 1643US7741861B2Test apparatus for the testing of electronic componentsMULTITEST ELEKTRONISCHE SYST·Filed 2007·Granted Jun 22, 2010·2 cites·7 claims
- 1743US6836109B2Guiding apparatus for docking a testing head for electronic componentsMULTITEST ELEKTRONISCHE SYST·Filed 2003·Granted Dec 28, 2004·3 cites·7 claims
- 1841US2013335112A1Device for testing electronic component devicesMULTITEST ELEKTRONISCHE SYST·Filed 2013·Application pending·0 cites
- 1941US2013335108A1Device and method for testing electronic component devices on a carrier or a substrateMULTITEST ELEKTRONISCHE SYST·Filed 2013·Application pending·0 cites
- 2036US2010209864A1Tempering chamber for tempering electronic components in particular ic'sMULTITEST ELEKTRONISCHE SYST·Filed 2008·Application pending·0 cites
- 2136US2013321011A1Test device, test system, method and carrier for testing electronic components under variable pressure conditionsMULTITEST ELEKTRONISCHE SYST·Filed 2013·Application pending·0 cites
- 2233US2010164482A1Centering device for electronic components, particularly icsMULTITEST ELEKTRONISCHE SYST·Filed 2008·Application pending·0 cites
- 2331US7946405B2Guide path for electronic componentsMULTITEST ELEKTRONISCHE SYST·Filed 2007·Granted May 24, 2011·0 cites·8 claims
- 2427US7677383B2Guide path for electronic componentsMULTITEST ELEKTRONISCHE SYST·Filed 2006·Granted Mar 16, 2010·0 cites·5 claims
- 2522US4651090ADevice for receiving components, particularly integrated chips, in an input and/or output magazine of a component testing machineMULTITEST ELEKTRONISCHE SYST·Filed 1985·Granted Mar 17, 1987·5 cites·6 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →