Assignee
MURATA YASUHITO
JP·4 granted patents·11 citations·filing 2004–2012
Top patents by PatentIndex Score
4 records- 0175US8578789B2Analysis device and analysis methodMURATA YASUHITO·Filed 2009·Granted Nov 12, 2013·11 cites·2 claims
- 0247US8142735B2Test apparatusMURATA YASUHITO·Filed 2010·Granted Mar 27, 2012·0 cites·8 claims
- 0346US8696993B2Method of raising temperature of received object, and analyzing deviceMURATA YASUHITO·Filed 2004·Granted Apr 15, 2014·0 cites·11 claims
- 0439US9537481B2DC insulation semiconductor relay deviceMURATA YASUHITO·Filed 2012·Granted Jan 3, 2017·0 cites·5 claims
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