Assignee

MURAYAMA KEN

0 granted patents·2 pending applications·0 citations·filing 2004–2006

Technology mixB82Y2 G01Q2

Top patents by PatentIndex Score

2 records

0143US2009140142A1Scanning probe microscope and measuring method therebyMURAYAMA KEN·Filed 2006·Application pending·0 cites
0233US2007180889A1Probe replacement method for scanning probe microscopeMURAYAMA KEN·Filed 2004·Application pending·0 cites

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