Assignee
NAGAI KOUICHI
JP·15 granted patents·1 pending application·21 citations·filing 2006–2012
Top patents by PatentIndex Score
16 records- 0189US8921125B2Method of making ferroelectric memory device with barrier layer and novolac resin passivation layerNAGAI KOUICHI·Filed 2012·Granted Dec 30, 2014·9 cites·5 claims
- 0275US8212300B2Semiconductor deviceNAGAI KOUICHI·Filed 2009·Granted Jul 3, 2012·4 cites·9 claims
- 0369US8552484B2Semiconductor device and method for fabricating the sameNAGAI KOUICHI·Filed 2006·Granted Oct 8, 2013·4 cites·9 claims
- 0465US8237264B2Method of manufacturing semiconductor device and thermal annealing apparatusNAGAI KOUICHI·Filed 2011·Granted Aug 7, 2012·1 cites·7 claims
- 0563US8274152B2Semiconductor device having a contact hole extending from an upper surface of an insulating film and reaching one of a plurality of impurity regions constituting a transistor and method of manufacturing the sameNAGAI KOUICHI·Filed 2006·Granted Sep 25, 2012·2 cites·4 claims
- 0658US8658493B2Manufacturing method of semiconductor deviceNAGAI KOUICHI·Filed 2009·Granted Feb 25, 2014·1 cites·14 claims
- 0758US8425226B2Heat treatment apparatus and method of manufacturing semiconductor deviceNAGAI KOUICHI·Filed 2009·Granted Apr 23, 2013·0 cites·7 claims
- 0855US8582343B2Semiconductor storage device, semiconductor storage device manufacturing method and package resin forming methodNAGAI KOUICHI·Filed 2009·Granted Nov 12, 2013·0 cites·12 claims
- 0953US8334533B2Semiconductor device including a circuit area and a monitor area having a plurality of monitor layers and method for manufacturing the sameNAGAI KOUICHI·Filed 2007·Granted Dec 18, 2012·0 cites·11 claims
- 1052US8796043B2Semiconductor device and method for manufacturing the sameNAGAI KOUICHI·Filed 2012·Granted Aug 5, 2014·0 cites·6 claims
- 1152US2008186183A1Goods/item management system and goods/item management methodNAGAI KOUICHI·Filed 2008·Application pending·0 cites
- 1250US8633036B2Manufacturing method of ferroelectric capacitorNAGAI KOUICHI·Filed 2012·Granted Jan 21, 2014·0 cites·7 claims
- 1349US8742479B2Semiconductor device and method of manufacturing the sameNAGAI KOUICHI·Filed 2012·Granted Jun 3, 2014·0 cites·13 claims
- 1448US9129853B2Semiconductor device and method of manufacturing the sameNAGAI KOUICHI·Filed 2012·Granted Sep 8, 2015·0 cites·9 claims
- 1547US9064877B2Semiconductor wafer and method of testing the sameNAGAI KOUICHI·Filed 2007·Granted Jun 23, 2015·0 cites·10 claims
- 1647US8628981B2Method of manufacturing a ferroelectric-capacitor memory device including recovery annealingNAGAI KOUICHI·Filed 2009·Granted Jan 14, 2014·0 cites·20 claims
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