Assignee
NAGAKUBO YASUHIRA
JP·4 granted patents·16 citations·filing 2010–2011
Top patents by PatentIndex Score
4 records- 0181US8853648B2Sample holder, method for use of the sample holder, and charged particle deviceNAGAKUBO YASUHIRA·Filed 2010·Granted Oct 7, 2014·5 cites·12 claims
- 0275US8729497B2Sample device for charged particle beamNAGAKUBO YASUHIRA·Filed 2011·Granted May 20, 2014·4 cites·15 claims
- 0337USD651226SSample case for an electron microscopeNAGAKUBO YASUHIRA·Filed 2011·Granted Dec 27, 2011·4 cites·1 claims
- 0433USD660335SFixation device for a sample case for an electron microscopeNAGAKUBO YASUHIRA·Filed 2011·Granted May 22, 2012·3 cites·1 claims
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