Assignee
NAGANO MAKOTO
JP·2 granted patents·2 citations·filing 2007–2010
Top patents by PatentIndex Score
2 records- 0163US8236681B2Manufacturing method of semiconductor integrated circuit deviceNAGANO MAKOTO·Filed 2010·Granted Aug 7, 2012·2 cites·26 claims
- 0243US8099633B2Circuit for testing a USB device using a packet to be measured controlled by test signalsNAGANO MAKOTO·Filed 2007·Granted Jan 17, 2012·0 cites·8 claims
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