Assignee
NAGAOKI ISAO
JP·2 granted patents·1 pending application·6 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0171US8586922B2Transmission electron microscope and sample observation methodNAGAOKI ISAO·Filed 2010·Granted Nov 19, 2013·4 cites·8 claims
- 0268US8426811B2Electron microscopeNAGAOKI ISAO·Filed 2009·Granted Apr 23, 2013·2 cites·11 claims
- 0336US2013163076A1Transmission interference microscopeNAGAOKI ISAO·Filed 2011·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →