Assignee
NAGASAKI KENJI
JP·3 granted patents·5 citations·filing 2007–2010
Top patents by PatentIndex Score
3 records- 0161US8237450B2Method of testing insulation property of wafer-level chip scale package and TEG pattern used in the methodNAGASAKI KENJI·Filed 2009·Granted Aug 7, 2012·2 cites·18 claims
- 0260US8200412B2Controller for internal combustion engineNAGASAKI KENJI·Filed 2007·Granted Jun 12, 2012·3 cites·10 claims
- 0343US8581408B2Semiconductor deviceNAGASAKI KENJI·Filed 2010·Granted Nov 12, 2013·0 cites·17 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →