Assignee
NAGASAWA NOBUYUKI
0 granted patents·5 pending applications·0 citations·filing 2005–2007
Top patents by PatentIndex Score
5 records- 0149US2008106786A1Examination method and examination apparatusNAGASAWA NOBUYUKI·Filed 2007·Application pending·0 cites
- 0247US2007115543A1Examination method and examination apparatusNAGASAWA NOBUYUKI·Filed 2007·Application pending·0 cites
- 0344US2005280892A1Examination method and examination apparatusNAGASAWA NOBUYUKI·Filed 2005·Application pending·0 cites
- 0440US2006193496A1Examination method and examination-assisting toolNAGASAWA NOBUYUKI·Filed 2006·Application pending·0 cites
- 0539US2006009682A1In-vivo examination apparatusNAGASAWA NOBUYUKI·Filed 2005·Application pending·0 cites
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