Assignee
NAGATANI KENICHI
JP·3 granted patents·5 citations·filing 2007–2009
Top patents by PatentIndex Score
3 records- 0157US8145965B2Test apparatus for testing a device under test and device for receiving a signalNAGATANI KENICHI·Filed 2008·Granted Mar 27, 2012·4 cites·20 claims
- 0247US8599910B2Jitter addition apparatus and test apparatusNAGATANI KENICHI·Filed 2009·Granted Dec 3, 2013·1 cites·14 claims
- 0334US8090009B2Test apparatusNAGATANI KENICHI·Filed 2007·Granted Jan 3, 2012·0 cites·7 claims
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