Assignee
NAKAHIRA KENJI
JP·8 granted patents·1 pending application·30 citations·filing 2008–2012
Top patents by PatentIndex Score
9 records- 0192US8461527B2Scanning electron microscope and method for processing an image obtained by the scanning electron microscopeNAKAHIRA KENJI·Filed 2012·Granted Jun 11, 2013·10 cites·12 claims
- 0285US8237119B2Scanning type charged particle beam microscope and an image processing method using the sameNAKAHIRA KENJI·Filed 2009·Granted Aug 7, 2012·8 cites·11 claims
- 0381US8106357B2Scanning electron microscope and method for processing an image obtained by the scanning electron microscopeNAKAHIRA KENJI·Filed 2008·Granted Jan 31, 2012·5 cites·11 claims
- 0471US9341584B2Charged-particle microscope device and method for inspecting sample using sameNAKAHIRA KENJI·Filed 2010·Granted May 17, 2016·3 cites·9 claims
- 0567US8730318B2Inspection apparatus and method for producing image for inspectionNAKAHIRA KENJI·Filed 2011·Granted May 20, 2014·1 cites·8 claims
- 0663US8585599B2Ultrasonographic device and method for improving ultrasonographic device image qualityNAKAHIRA KENJI·Filed 2008·Granted Nov 19, 2013·3 cites·8 claims
- 0745US9460889B2Charged particle microscope device and image capturing methodNAKAHIRA KENJI·Filed 2012·Granted Oct 4, 2016·0 cites·8 claims
- 0845US9267898B2Optical inspection method and optical inspection apparatusNAKAHIRA KENJI·Filed 2011·Granted Feb 23, 2016·0 cites·4 claims
- 0937US2012041312A1Method for Improving Image Quality of Ultrasonic Image, Ultrasonic Diagnosis Device, and Program for Improving Image QualityNAKAHIRA KENJI·Filed 2010·Application pending·0 cites
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