Assignee
NAKAMURA TOMONORI
JP·7 granted patents·4 pending applications·21 citations·filing 2003–2012
Top patents by PatentIndex Score
11 records- 0188US9099350B2Apparatus for inspecting integrated circuitNAKAMURA TOMONORI·Filed 2012·Granted Aug 4, 2015·7 cites·7 claims
- 0283US8503869B2Stereoscopic video playback device and stereoscopic video display deviceNAKAMURA TOMONORI·Filed 2009·Granted Aug 6, 2013·8 cites·7 claims
- 0373US8937310B2Detection method for semiconductor integrated circuit device, and semiconductor integrated circuit deviceNAKAMURA TOMONORI·Filed 2011·Granted Jan 20, 2015·3 cites·14 claims
- 0465US8178940B2Schottky barrier diode and method for using the sameNAKAMURA TOMONORI·Filed 2006·Granted May 15, 2012·3 cites·3 claims
- 0554US9411143B2Optical device for microscopic observationNAKAMURA TOMONORI·Filed 2012·Granted Aug 9, 2016·0 cites·13 claims
- 0650US9658116B2Method for detecting heat generation points and device for detecting heat generate pointsNAKAMURA TOMONORI·Filed 2012·Granted May 23, 2017·0 cites·10 claims
- 0749US9575020B2Heat generation point detection method and heat generation point detection deviceNAKAMURA TOMONORI·Filed 2012·Granted Feb 21, 2017·0 cites·6 claims
- 0843US2005273781A1Service software acquiring method, system and electronic communication device used thereforNAKAMURA TOMONORI·Filed 2003·Application pending·0 cites
- 0942US2007271446A1Application Execution Device and Application Execution Device Application Execution MethodNAKAMURA TOMONORI·Filed 2005·Application pending·0 cites
- 1042US2008270806A1Execution DeviceNAKAMURA TOMONORI·Filed 2005·Application pending·0 cites
- 1138US2013082260A1Semiconductor integrated circuit device inspection method and semiconductor integrated circuit deviceNAKAMURA TOMONORI·Filed 2011·Application pending·0 cites
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