Assignee
NAKAMURA TSUYOSHI
JP·10 granted patents·3 pending applications·36 citations·filing 2004–2012
Top patents by PatentIndex Score
13 records- 0192US8881506B2Hydraulic drive device of hydraulic operating machineNAKAMURA TSUYOSHI·Filed 2010·Granted Nov 11, 2014·13 cites·3 claims
- 0280US8693801B2Image processing device, image processing method, and integrated circuitNAKAMURA TSUYOSHI·Filed 2011·Granted Apr 8, 2014·6 cites·10 claims
- 0374US9341198B2Hydraulic drive device for working machineNAKAMURA TSUYOSHI·Filed 2012·Granted May 17, 2016·6 cites·22 claims
- 0471US8297615B2Sheet processing apparatus and cartNAKAMURA TSUYOSHI·Filed 2009·Granted Oct 30, 2012·5 cites·8 claims
- 0567US8141863B2Sheet processing apparatusNAKAMURA TSUYOSHI·Filed 2009·Granted Mar 27, 2012·4 cites·10 claims
- 0664US8865395B2Method of forming resist patternNAKAMURA TSUYOSHI·Filed 2012·Granted Oct 21, 2014·1 cites·4 claims
- 0756US9248489B2Press-forming method and press-forming apparatusNAKAMURA TSUYOSHI·Filed 2012·Granted Feb 2, 2016·1 cites·2 claims
- 0852US2010232768A1Recording device, reproducing device, and methodNAKAMURA TSUYOSHI·Filed 2009·Application pending·0 cites
- 0951US8300692B2Moving picture coding method, moving picture decoding method, moving picture coding device, and moving picture decoding deviceNAKAMURA TSUYOSHI·Filed 2008·Granted Oct 30, 2012·0 cites·13 claims
- 1042US8330835B2Image capturing apparatusNAKAMURA TSUYOSHI·Filed 2010·Granted Dec 11, 2012·0 cites·5 claims
- 1139US2006281029A1Resin for under-layer material, under-layer material, laminate and method for forming resist patternNAKAMURA TSUYOSHI·Filed 2004·Application pending·0 cites
- 1239US2006222866A1Silsesquioxane resin, positive resist composition,layered product including resist and method of forming resist patternNAKAMURA TSUYOSHI·Filed 2004·Application pending·0 cites
- 1334US9187450B2Substituted pyridine compoundNAKAMURA TSUYOSHI·Filed 2011·Granted Nov 17, 2015·0 cites·35 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →