Assignee
NAKANISHI HIDETOSHI
JP·4 granted patents·8 citations·filing 2011–2012
Top patents by PatentIndex Score
4 records- 0182US8872114B2Inspection apparatus and inspection methodNAKANISHI HIDETOSHI·Filed 2012·Granted Oct 28, 2014·5 cites·17 claims
- 0266US8455997B2High power semiconductor deviceNAKANISHI HIDETOSHI·Filed 2011·Granted Jun 4, 2013·2 cites·3 claims
- 0362US8941824B2Semiconductor inspection method and semiconductor inspection apparatusNAKANISHI HIDETOSHI·Filed 2012·Granted Jan 27, 2015·1 cites·6 claims
- 0451US8530868B2Electromagnetic radiation generating element, electromagnetic radiation generating device, and method of generating electromagnetic radiationNAKANISHI HIDETOSHI·Filed 2012·Granted Sep 10, 2013·0 cites·12 claims
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