Assignee
NAKANO RIKIZO
JP·3 granted patents·17 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0181US8738976B2Memory error detecting apparatus and methodNAKANO RIKIZO·Filed 2011·Granted May 27, 2014·9 cites·6 claims
- 0278US8423842B2Test apparatus and test method for testing a memory deviceNAKANO RIKIZO·Filed 2010·Granted Apr 16, 2013·8 cites·15 claims
- 0337US8868990B2Semiconductor memory device and information processing apparatus including the sameNAKANO RIKIZO·Filed 2012·Granted Oct 21, 2014·0 cites·12 claims
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