Assignee
NAKAO TOSHIYUKI
JP·5 granted patents·1 pending application·15 citations·filing 2009–2012
Top patents by PatentIndex Score
6 records- 0183US8670116B2Method and device for inspecting for defectsNAKAO TOSHIYUKI·Filed 2011·Granted Mar 11, 2014·6 cites·16 claims
- 0281US8638429B2Defect inspecting method and defect inspecting apparatusNAKAO TOSHIYUKI·Filed 2009·Granted Jan 28, 2014·5 cites·16 claims
- 0379US8482727B2Defect inspection methodNAKAO TOSHIYUKI·Filed 2012·Granted Jul 9, 2013·2 cites·13 claims
- 0479US8115915B2Defect inspection method and apparatusNAKAO TOSHIYUKI·Filed 2011·Granted Feb 14, 2012·2 cites·13 claims
- 0545US9041921B2Defect inspection device and defect inspection methodNAKAO TOSHIYUKI·Filed 2011·Granted May 26, 2015·0 cites·6 claims
- 0637US2012092656A1Defect Inspection Method and Defect Inspection ApparatusNAKAO TOSHIYUKI·Filed 2010·Application pending·0 cites
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