Assignee
NAKATA TOSHIHIKO
JP·11 granted patents·26 citations·filing 2006–2012
Top patents by PatentIndex Score
11 records- 0182US8181268B2Scanning probe microscope and method of observing sample using the sameNAKATA TOSHIHIKO·Filed 2008·Granted May 15, 2012·6 cites·20 claims
- 0279US8407811B2Scanning probe microscope and method of observing sample using the sameNAKATA TOSHIHIKO·Filed 2010·Granted Mar 26, 2013·4 cites·16 claims
- 0375US8629985B2Displacement measurement method and apparatus thereof, stage apparatus, and probe microscopeNAKATA TOSHIHIKO·Filed 2012·Granted Jan 14, 2014·3 cites·18 claims
- 0473US8695110B2Scanning probe microscope and sample observing method using the sameNAKATA TOSHIHIKO·Filed 2012·Granted Apr 8, 2014·2 cites·16 claims
- 0572US8635710B2Scanning probe microscope and method of observing sample using the sameNAKATA TOSHIHIKO·Filed 2012·Granted Jan 21, 2014·2 cites·12 claims
- 0672US8272068B2Scanning probe microscope and sample observing method using the sameNAKATA TOSHIHIKO·Filed 2008·Granted Sep 18, 2012·4 cites·12 claims
- 0762US8284406B2Displacement measurement method and apparatus thereof, stage apparatus, and probe microscopeNAKATA TOSHIHIKO·Filed 2006·Granted Oct 9, 2012·3 cites·18 claims
- 0856US8659761B2Method and apparatus for measuring displacement of a sample using a wire grid polarizer to generate interference lightNAKATA TOSHIHIKO·Filed 2011·Granted Feb 25, 2014·0 cites·9 claims
- 0955US8860946B2Polarizing different phases of interfered light used in a method and apparatus for measuring displacement of a specimenNAKATA TOSHIHIKO·Filed 2008·Granted Oct 14, 2014·2 cites·28 claims
- 1049US9134279B2Internal defect inspection method and apparatus for the sameNAKATA TOSHIHIKO·Filed 2011·Granted Sep 15, 2015·0 cites·14 claims
- 1148US8064066B2Method and apparatus for measuring displacement of a sample to be inspected using an interference lightNAKATA TOSHIHIKO·Filed 2009·Granted Nov 22, 2011·0 cites·14 claims
Join the waitlist — get patent alerts
Get an alert when NAKATA TOSHIHIKO files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →