Assignee

NAKATA YOSHIROU

JP·2 granted patents·6 citations·filing 2010–2010

Technology mixG01R2

Top patents by PatentIndex Score

2 records

0180US8659312B2Probe card and semiconductor wafer inspection method using the sameNAKATA YOSHIROU·Filed 2010·Granted Feb 25, 2014·6 cites·17 claims
0246US8400182B2Wafer inspection device and semiconductor wafer inspection method using the sameNAKATA YOSHIROU·Filed 2010·Granted Mar 19, 2013·0 cites·3 claims

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