Assignee
NAKAZAWA HARUO
JP·9 granted patents·1 pending application·5 citations·filing 2009–2012
Top patents by PatentIndex Score
10 records- 0164US8999768B2Semiconductor device manufacturing methodNAKAZAWA HARUO·Filed 2011·Granted Apr 7, 2015·1 cites·9 claims
- 0262US8420512B2Method for manufacturing semiconductor deviceNAKAZAWA HARUO·Filed 2009·Granted Apr 16, 2013·1 cites·19 claims
- 0361US9418852B2Method of manufacturing a semiconductor deviceNAKAZAWA HARUO·Filed 2011·Granted Aug 16, 2016·1 cites·7 claims
- 0459US8460975B2Reverse block-type insulated gate bipolar transistor manufacturing methodNAKAZAWA HARUO·Filed 2011·Granted Jun 11, 2013·1 cites·8 claims
- 0556US8692350B2Semiconductor device and method of manufacturing the sameNAKAZAWA HARUO·Filed 2011·Granted Apr 8, 2014·1 cites·8 claims
- 0653US8697558B2Semiconductor device and manufacturing method thereofNAKAZAWA HARUO·Filed 2009·Granted Apr 15, 2014·0 cites·7 claims
- 0748US8759870B2Semiconductor deviceNAKAZAWA HARUO·Filed 2010·Granted Jun 24, 2014·0 cites·2 claims
- 0841US8853009B2Method for manufacturing reverse-blocking semiconductor elementNAKAZAWA HARUO·Filed 2012·Granted Oct 7, 2014·0 cites·13 claims
- 0940US10115587B2Method of manufacturing semiconductor deviceNAKAZAWA HARUO·Filed 2012·Granted Oct 30, 2018·0 cites·8 claims
- 1040US2012329257A1Method for manufacturing semiconductor deviceNAKAZAWA HARUO·Filed 2012·Application pending·0 cites
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