Assignee
NANOGEOMETRY RES INC
JP·3 granted patents·152 citations·filing 2005–2006
Top patents by PatentIndex Score
3 records- 0193US7796801B2Pattern inspection apparatus and methodNANOGEOMETRY RES INC·Filed 2006·Granted Sep 14, 2010·81 cites·18 claims
- 0289US7817844B2Pattern inspection apparatus and methodNANOGEOMETRY RES INC·Filed 2005·Granted Oct 19, 2010·47 cites·32 claims
- 0386US7660455B2Pattern inspection apparatus, pattern inspection method, and recording mediumNANOGEOMETRY RES INC·Filed 2005·Granted Feb 9, 2010·24 cites·22 claims
Join the waitlist — get patent alerts
Get an alert when NANOGEOMETRY RES INC files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →