Assignee
NAT INST OF METROLOGY P R CHINA
CN·2 granted patents·1 citations·filing 2014–2014
Top patents by PatentIndex Score
2 records- 0157US8953649B2Grating external-cavity semiconductor laser and quasi-synchronous method thereofNAT INST OF METROLOGY P R CHINA·Filed 2014·Granted Feb 10, 2015·1 cites·3 claims
- 0218US9347823B2Absolute measurement method and apparatus thereof for non-linear errorNAT INST OF METROLOGY P R CHINA·Filed 2014·Granted May 24, 2016·0 cites·12 claims
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