Assignee

NAT RES LAB OF METROLOGY

JP·1 granted patent·16 citations·filing 1999–1999

Technology mixG01K1 G01N1

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0143US6595685B2Method and apparatus for measuring thermophysical propertiesNAT RES LAB OF METROLOGY·Filed 1999·Granted Jul 22, 2003·16 cites·2 claims

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