Assignee
NEGISHI KAZUKI
US·2 granted patents·10 citations·filing 2009–2011
Top patents by PatentIndex Score
2 records- 0176US8319503B2Test apparatus for measuring a characteristic of a device under testNEGISHI KAZUKI·Filed 2009·Granted Nov 27, 2012·10 cites·23 claims
- 0228US8167648B2Low noise connector with cables having a center, middle and outer conductorsNEGISHI KAZUKI·Filed 2011·Granted May 1, 2012·0 cites·16 claims
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