Assignee
NIKON RES CORP OF AMERICA
US·6 granted patents·2 pending applications·170 citations·filing 1997–2017
Top patents by PatentIndex Score
8 records- 0183US6248000B1Polishing pad thinning to optically access a semiconductor wafer surfaceNIKON RES CORP OF AMERICA·Filed 1998·Granted Jun 19, 2001·72 cites·17 claims
- 0279US6261152B1Heterdoyne Thickness Monitoring SystemNIKON RES CORP OF AMERICA·Filed 1998·Granted Jul 17, 2001·49 cites·34 claims
- 0365US6302770B1In-situ pad conditioning for CMP polisherNIKON RES CORP OF AMERICA·Filed 1998·Granted Oct 16, 2001·23 cites·18 claims
- 0461US7244611B2Methods and devices for hybridization and binding assays using thermophoresisNIKON RES CORP OF AMERICA·Filed 2001·Granted Jul 17, 2007·3 cites·15 claims
- 0561US6733370B2In-situ pad conditioning apparatus for CMP polisherNIKON RES CORP OF AMERICA·Filed 2001·Granted May 11, 2004·8 cites·29 claims
- 0654US6204729B1H-bridge power amplifier for a motorNIKON RES CORP OF AMERICA·Filed 1997·Granted Mar 20, 2001·15 cites·16 claims
- 0738US2005162802A1Offset gap control for electromagnetic devicesNIKON RES CORP OF AMERICA·Filed 2004·Application pending·0 cites
- 0835US2017289465A1Multispectral eyewear deviceNIKON RES CORP OF AMERICA·Filed 2017·Application pending·0 cites
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