Assignee
NISHIOKA NAOHISA
JP·6 granted patents·34 citations·filing 2009–2014
Top patents by PatentIndex Score
6 records- 0194US8593891B2Semiconductor device and test method thereofNISHIOKA NAOHISA·Filed 2011·Granted Nov 26, 2013·18 cites·12 claims
- 0287US8239812B2Semiconductor device, adjustment method thereof and data processing systemNISHIOKA NAOHISA·Filed 2010·Granted Aug 7, 2012·6 cites·20 claims
- 0384US8981808B2Semiconductor device and test method thereofNISHIOKA NAOHISA·Filed 2010·Granted Mar 17, 2015·8 cites·12 claims
- 0477US9047989B2Semiconductor device, adjustment method thereof and data processing systemNISHIOKA NAOHISA·Filed 2014·Granted Jun 2, 2015·2 cites·15 claims
- 0555US8539410B2Semiconductor device, adjustment method thereof and data processing systemNISHIOKA NAOHISA·Filed 2012·Granted Sep 17, 2013·0 cites·20 claims
- 0643US8638631B2Semiconductor deviceNISHIOKA NAOHISA·Filed 2009·Granted Jan 28, 2014·0 cites·24 claims
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