Assignee
NODA AKIRA
JP·4 granted patents·2 citations·filing 2005–2010
Top patents by PatentIndex Score
4 records- 0168US8666681B2Mass analysis data analyzing method and mass analysis data analyzing apparatusNODA AKIRA·Filed 2008·Granted Mar 4, 2014·2 cites·11 claims
- 0250US8815010B2InP single crystal wafer and method for producing InP single crystalNODA AKIRA·Filed 2005·Granted Aug 26, 2014·0 cites·9 claims
- 0346US8106366B2Ion beam control apparatus and methodNODA AKIRA·Filed 2008·Granted Jan 31, 2012·0 cites·14 claims
- 0442US8710919B2Data processing methodNODA AKIRA·Filed 2010·Granted Apr 29, 2014·0 cites·8 claims
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