Assignee
NOJI NOBUHARU
JP·3 granted patents·9 citations·filing 2010–2013
Top patents by PatentIndex Score
3 records- 0183US8742341B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusNOJI NOBUHARU·Filed 2010·Granted Jun 3, 2014·4 cites·13 claims
- 0278US8859984B2Method and apparatus for inspecting sample surfaceNOJI NOBUHARU·Filed 2013·Granted Oct 14, 2014·2 cites·12 claims
- 0378US8525127B2Method and apparatus for inspecting sample surfaceNOJI NOBUHARU·Filed 2012·Granted Sep 3, 2013·3 cites·10 claims
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