Assignee
NOZUYAMA YASUYUKI
JP·4 granted patents·5 citations·filing 2006–2011
Top patents by PatentIndex Score
4 records- 0163US8508249B2Semiconductor integrated circuit and method for designing the sameNOZUYAMA YASUYUKI·Filed 2011·Granted Aug 13, 2013·1 cites·14 claims
- 0263US8082534B2Apparatus and method for calculating fault coverage, and fault detection methodNOZUYAMA YASUYUKI·Filed 2006·Granted Dec 20, 2011·4 cites·19 claims
- 0344US8185863B2Delay fault test quality calculation apparatus, delay fault test quality calculation method, and delay fault test pattern generation apparatusNOZUYAMA YASUYUKI·Filed 2011·Granted May 22, 2012·0 cites·5 claims
- 0442US8886487B2Bridge fault removal apparatus, bridge fault removal method, and computer readable medium comprising computer program code for removing bridge faultNOZUYAMA YASUYUKI·Filed 2010·Granted Nov 11, 2014·0 cites·15 claims
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