Individual holder
OBORINA ELENA I
US·2 granted patents·1 citations·filing 2012–2014
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
2 records- 0153US8803533B2Noncontact determination of interface trap density for semiconductor-dielectric interface structuresOBORINA ELENA I·Filed 2012·Granted Aug 12, 2014·1 cites·19 claims
- 0241US9041417B2Noncontact determination of interface trap density for semiconductor-dielectric interface structuresOBORINA ELENA I·Filed 2014·Granted May 26, 2015·0 cites·55 claims
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