Assignee

OGASHIWA TAKESHI

JP·1 granted patent·1 pending application·2 citations·filing 2005–2012

Technology mixH01J2

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2 records

0163US8853647B2Electron microscopeOGASHIWA TAKESHI·Filed 2012·Granted Oct 7, 2014·2 cites·14 claims
0239US2006219907A1Charged particle beam apparatus, method of displaying sample image, and method of measuring image shift sensitivityOGASHIWA TAKESHI·Filed 2005·Application pending·0 cites

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