Assignee
OKAI NOBUHIRO
JP·4 granted patents·11 citations·filing 2008–2011
Top patents by PatentIndex Score
4 records- 0173US8742342B2Electron microscopeOKAI NOBUHIRO·Filed 2010·Granted Jun 3, 2014·3 cites·14 claims
- 0267US9261360B2Charged particle beam microscopeOKAI NOBUHIRO·Filed 2011·Granted Feb 16, 2016·2 cites·8 claims
- 0365US8125518B2Scanning electron microscopeOKAI NOBUHIRO·Filed 2009·Granted Feb 28, 2012·1 cites·14 claims
- 0463US8064681B2Method and apparatus for inspecting reticleOKAI NOBUHIRO·Filed 2008·Granted Nov 22, 2011·5 cites·16 claims
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