Assignee
OKOROANYANWU UZODINMA
US·2 granted patents·3 citations·filing 2007–2007
Technology mixG03F2
Top patents by PatentIndex Score
2 records- 0170US8586269B2Method for forming a high resolution resist pattern on a semiconductor waferOKOROANYANWU UZODINMA·Filed 2007·Granted Nov 19, 2013·3 cites·20 claims
- 0244US8715912B2Method for producing a high resolution resist pattern on a semiconductor waferOKOROANYANWU UZODINMA·Filed 2007·Granted May 6, 2014·0 cites·20 claims
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