Assignee
OMINAMI YUSUKE
JP·6 granted patents·1 pending application·25 citations·filing 2009–2012
Top patents by PatentIndex Score
7 records- 0193US8710439B2Charged particle beam apparatusOMINAMI YUSUKE·Filed 2012·Granted Apr 29, 2014·15 cites·23 claims
- 0283US8933400B2Inspection or observation apparatus and sample inspection or observation methodOMINAMI YUSUKE·Filed 2012·Granted Jan 13, 2015·5 cites·13 claims
- 0372US9543111B2Charged particle beam deviceOMINAMI YUSUKE·Filed 2011·Granted Jan 10, 2017·3 cites·23 claims
- 0470US8086021B2Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscopeOMINAMI YUSUKE·Filed 2009·Granted Dec 27, 2011·2 cites·17 claims
- 0554US9165741B2Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sampleOMINAMI YUSUKE·Filed 2012·Granted Oct 20, 2015·0 cites·18 claims
- 0646US8242443B2Semiconductor device inspection apparatusOMINAMI YUSUKE·Filed 2010·Granted Aug 14, 2012·0 cites·4 claims
- 0738US2012091339A1Charged-particle microscope device, and method of controlling charged-particle beamsOMINAMI YUSUKE·Filed 2010·Application pending·0 cites
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