Assignee

OMORI SEIKO

US·2 granted patents·5 citations·filing 2010–2011

Technology mixH01J2 G01B1 G03F1

Top patents by PatentIndex Score

2 records

0170US9110384B2Scanning electron microscopeOMORI SEIKO·Filed 2011·Granted Aug 18, 2015·3 cites·8 claims
0261US8309923B2Sample observing method and scanning electron microscopeOMORI SEIKO·Filed 2010·Granted Nov 13, 2012·2 cites·11 claims

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