Assignee
OMOTE KAZUHIKO
JP·4 granted patents·26 citations·filing 2009–2011
Top patents by PatentIndex Score
4 records- 0188US8908830B2Surface microstructure measurement method, surface microstructure measurement data analysis method and X-ray scattering measurement deviceOMOTE KAZUHIKO·Filed 2010·Granted Dec 9, 2014·11 cites·15 claims
- 0282US8085900B2Method for X-ray wavelength measurement and X-ray wavelength measurement apparatusOMOTE KAZUHIKO·Filed 2009·Granted Dec 27, 2011·13 cites·16 claims
- 0364US8767918B2X-ray scattering measurement device and X-ray scattering measurement methodOMOTE KAZUHIKO·Filed 2010·Granted Jul 1, 2014·2 cites·16 claims
- 0446US8699663B2X-ray image photographing method and X-ray image photographing apparatusOMOTE KAZUHIKO·Filed 2011·Granted Apr 15, 2014·0 cites·7 claims
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