Assignee

ONIYAMA KYOKO

US·2 granted patents·7 citations·filing 2010–2010

Technology mixH01R2 G01R1

Top patents by PatentIndex Score

2 records

0158US8860454B2Connector and semiconductor testing device including the connectorONIYAMA KYOKO·Filed 2010·Granted Oct 14, 2014·5 cites·3 claims
0247US8905788B2Connector and semiconductor testing device including the connectorONIYAMA KYOKO·Filed 2010·Granted Dec 9, 2014·2 cites·7 claims

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