Assignee
OPTIMALTEST LTD
IL9 patents
Top patents by PatentIndex Score
US7969174B2Jun 28, 2011
Systems and methods for test time outlier detection and correction in integrated circuit testing
OPTIMALTEST LTD13 citations90
US7340359B2Mar 4, 2008
Augmenting semiconductor's devices quality and reliability
OPTIMALTEST LTD23 citations90
US7532024B2May 12, 2009
Methods and systems for semiconductor testing using reference dice
OPTIMALTEST LTD9 citations83
US7208969B2Apr 24, 2007
Optimize parallel testing
OPTIMALTEST LTD12 citations81
US7777515B2Aug 17, 2010
Methods and systems for semiconductor testing using reference dice
OPTIMALTEST LTD4 citations72
US7737716B2Jun 15, 2010
Methods and systems for semiconductor testing using reference dice
OPTIMALTEST LTD3 citations61
US7679392B2Mar 16, 2010
Methods and systems for semiconductor testing using reference dice
OPTIMALTEST LTD3 citations61
US7567947B2Jul 28, 2009
Methods and systems for semiconductor testing using a testing scenario language
OPTIMALTEST LTD4 citations61
US8872538B2Oct 28, 2014
Systems and methods for test time outlier detection and correction in integrated circuit testing
OPTIMALTEST LTD0 citations50