Assignee
ORTNER ANDREAS
DE·1 granted patent·1 pending application·9 citations·filing 2009–2010
Top patents by PatentIndex Score
2 records- 0180US9157869B2Method and device for detecting cracks in semiconductor substratesORTNER ANDREAS·Filed 2010·Granted Oct 13, 2015·9 cites·20 claims
- 0245US2011189379A1Method for the thermographic inspection of nonmetallic materials, particularly coated nonmetallic materials, as well as method for the production thereof and an object produced according to the methodORTNER ANDREAS·Filed 2009·Application pending·0 cites
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