Assignee
OSANAI YOSUKE
JP2 patents
Top patents by PatentIndex Score
US9660512B2May 23, 2017
Electronic device for acquiring specific information of respective switching elements
OSANAI YOSUKE2 citations68
US9379029B2Jun 28, 2016
Inspection apparatus, inspection system, inspection method of semiconductor devices, and manufacturing method of inspected semiconductor devices
OSANAI YOSUKE2 citations59