Assignee
OTANI YUKITOSHI
JP·1 granted patent·1 pending application·4 citations·filing 2006–2007
Top patents by PatentIndex Score
2 records- 0164US8107075B2Optical characteristic measuring apparatus and optical characteristics measuring methodOTANI YUKITOSHI·Filed 2006·Granted Jan 31, 2012·4 cites·10 claims
- 0231US2010103417A1Optical Characteristic Measuring Apparatus, Optical Characteristic Measuring Method, and Optical Characteristic Measuring UnitOTANI YUKITOSHI·Filed 2007·Application pending·0 cites
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