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PACK ROBERT C
US3 patents
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US8468482B1Jun 18, 2013
Modeling and simulating the impact of imperfectly patterned via arrays on integrated circuits
PACK ROBERT C41 citations93
US8453102B1May 28, 2013
Hierarchical variation analysis of integrated circuits
PACK ROBERT C59 citations93
US8407627B2Mar 26, 2013
Method and system for context-specific mask inspection
PACK ROBERT C7 citations83