Assignee
PAGANI ALBERTO
IT23 patents
Top patents by PatentIndex Score
US9541601B2Jan 10, 2017
Testing architecture of circuits integrated on a wafer
PAGANI ALBERTO9 citations84
US9224694B2Dec 29, 2015
Traceable integrated circuits and production method thereof
PAGANI ALBERTO11 citations84
US9188635B2Nov 17, 2015
Integrated circuit comprising at least an integrated antenna
PAGANI ALBERTO6 citations84
US9146273B2Sep 29, 2015
Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic device
PAGANI ALBERTO8 citations84
US9134367B2Sep 15, 2015
Sensing structure of alignment of a probe for testing integrated circuits
PAGANI ALBERTO5 citations84
US9111895B2Aug 18, 2015
System and method for electrical testing of through silicon vias (TSVs)
PAGANI ALBERTO10 citations84
US9112263B2Aug 18, 2015
Electronic communications device with antenna and electromagnetic shield
PAGANI ALBERTO8 citations84
US9000788B2Apr 7, 2015
Method for performing an electrical testing of electronic devices
PAGANI ALBERTO12 citations84
US8907693B2Dec 9, 2014
Electromagnetic shield for testing integrated circuits
PAGANI ALBERTO4 citations84
US8902016B2Dec 2, 2014
Signal transmission through LC resonant circuits
PAGANI ALBERTO7 citations84
US9929089B2Mar 27, 2018
Inductive connection structure for use in an integrated circuit
PAGANI ALBERTO3 citations73
US9097637B2Aug 4, 2015
Integrated electronic device for monitoring parameters within a solid structure and monitoring system using such a device
PAGANI ALBERTO5 citations73
US8604570B2Dec 10, 2013
Integrated electronic device with transceiving antenna and magnetic interconnection
PAGANI ALBERTO4 citations73
US8941401B2Jan 27, 2015
Test circuit of an integrated circuit on a wafer
PAGANI ALBERTO2 citations63
US8791711B2Jul 29, 2014
Testing of electronic devices through capacitive interface
PAGANI ALBERTO2 citations63
US8604816B2Dec 10, 2013
Probe card for testing integrated circuits
PAGANI ALBERTO2 citations63
US8441272B2May 14, 2013
MEMS probe for probe cards for integrated circuits
PAGANI ALBERTO2 citations63
US9275962B2Mar 1, 2016
Probe pad with indentation
PAGANI ALBERTO0 citations52
US9229031B2Jan 5, 2016
Probes for testing integrated electronic circuits and corresponding production method
PAGANI ALBERTO0 citations52
US8643395B2Feb 4, 2014
Crosstalk suppression in wireless testing of semiconductor devices
PAGANI ALBERTO0 citations52
US8479066B2Jul 2, 2013
Process for making an electric testing of electronic devices
PAGANI ALBERTO1 citations52
US8829931B2Sep 9, 2014
Testing method for semiconductor integrated electronic devices and corresponding test architecture
PAGANI ALBERTO1 citations51
US9008785B2Apr 14, 2015
Retinal prosthesis
PAGANI ALBERTO0 citations42