Individual holder
PANNESE PATRICK D
US·8 granted patents·4 pending applications·46 citations·filing 2007–2008
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
12 records- 0187US8473270B2Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Granted Jun 25, 2013·7 cites·21 claims
- 0287US8442667B2Applications of neural networksPANNESE PATRICK D·Filed 2008·Granted May 14, 2013·6 cites·8 claims
- 0386US8972029B2Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Granted Mar 3, 2015·6 cites·18 claims
- 0486US8775148B2Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Granted Jul 8, 2014·6 cites·18 claims
- 0582US8612198B2Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Granted Dec 17, 2013·4 cites·20 claims
- 0678US10444749B2Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Granted Oct 15, 2019·3 cites·18 claims
- 0778US8639365B2Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Granted Jan 28, 2014·9 cites·20 claims
- 0869US8639489B2Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Granted Jan 28, 2014·5 cites·19 claims
- 0956US2007282480A1Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Application pending·0 cites
- 1045US2008208372A1Scheduling with neural networks and state machinesPANNESE PATRICK D·Filed 2008·Application pending·0 cites
- 1145US2008134076A1Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Application pending·0 cites
- 1245US2008163096A1Methods and systems for controlling a semiconductor fabrication processPANNESE PATRICK D·Filed 2007·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →