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PEI GEN

US2 patents

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US8400854B2Mar 19, 2013

Identifying at-risk data in non-volatile storage

PEI GEN8 citations80

US9373548B2Jun 21, 2016

CMOS circuit having a tensile stress layer overlying an NMOS transistor and overlapping a portion of compressive stress layer

PEI GEN0 citations48