Assignee
PERNG MING-HWEI
TW·1 granted patent·2 pending applications·9 citations·filing 2010–2010
Top patents by PatentIndex Score
3 records- 0173US8077827B2Method for thickness calibration and measuring thickness of materialPERNG MING-HWEI·Filed 2010·Granted Dec 13, 2011·9 cites·20 claims
- 0229US2011085026A1Detection method and detection system of moving objectPERNG MING-HWEI·Filed 2010·Application pending·0 cites
- 0328US2011074927A1Method for determining ego-motion of moving platform and detection systemPERNG MING-HWEI·Filed 2010·Application pending·0 cites
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