Assignee
POLYTEC GMBH
DE·19 granted patents·4 pending applications·76 citations·filing 1998–2020
Top patents by PatentIndex Score
23 records- 0174US9638513B2Device and method for the interferometric measuring of an objectPOLYTEC GMBH·Filed 2015·Granted May 2, 2017·2 cites·20 claims
- 0273US7443513B2Apparatus for optical measurement of an objectPOLYTEC GMBH·Filed 2005·Granted Oct 28, 2008·7 cites·22 claims
- 0372US7852487B2Heterodyne interferometer device for optically measuring an objectPOLYTEC GMBH·Filed 2008·Granted Dec 14, 2010·9 cites·17 claims
- 0464US9551726B2Device and method for an interferometric measuring of an objectPOLYTEC GMBH·Filed 2013·Granted Jan 24, 2017·2 cites·15 claims
- 0563US9212896B2Optical interferometer and vibrometer comprising such an optical interferometerPOLYTEC GMBH·Filed 2014·Granted Dec 15, 2015·2 cites·17 claims
- 0660US7808646B2Interferometer for optically measuring an objectPOLYTEC GMBH·Filed 2008·Granted Oct 5, 2010·4 cites·2 claims
- 0755US12345563B2Method and apparatus for interferometric vibration measurement at a plurality of measurement points by means of a measuring laser beamPOLYTEC GMBH·Filed 2020·Granted Jul 1, 2025·0 cites·15 claims
- 0855US6084672ADevice for optically measuring an object using a laser interferometerPOLYTEC GMBH·Filed 1998·Granted Jul 4, 2000·20 cites·12 claims
- 0954US6386042B2Method and apparatus for two-dimensional vibration analysisPOLYTEC GMBH·Filed 2001·Granted May 14, 2002·6 cites·4 claims
- 1052US9910056B2Device and method for an interferometric measuring of an objectPOLYTEC GMBH·Filed 2017·Granted Mar 6, 2018·0 cites·16 claims
- 1152US7079227B2Optical assembly to be mounted on a microscope for measuring periodic movements of a microstructurePOLYTEC GMBH·Filed 2004·Granted Jul 18, 2006·4 cites·7 claims
- 1250US7079258B2Measurement device for non-contact detection of oscillations of an objectPOLYTEC GMBH·Filed 2003·Granted Jul 18, 2006·8 cites·11 claims
- 1342US6209396B1Method and apparatus for two-dimensional vibration analysisPOLYTEC GMBH·Filed 1999·Granted Apr 3, 2001·12 cites·17 claims
- 1441US7518101B2Scanning microscope for optically measuring an objectPOLYTEC GMBH·Filed 2007·Granted Apr 14, 2009·0 cites·13 claims
- 1541US2004166471A1Method and device for optical measurement of a cast model of a tooth in restorative dentistryPOLYTEC GMBH·Filed 2004·Application pending·0 cites
- 1640US12104896B2Interferometric measurement device and interferometric method for determining the surface topography of a measurement objectPOLYTEC GMBH·Filed 2020·Granted Oct 1, 2024·0 cites·19 claims
- 1739US11333485B2Alignment method for a beam-directing unit of an interferometric measuring device, and measuring device for carrying out an interferometric measurement by means of laser radiationPOLYTEC GMBH·Filed 2019·Granted May 17, 2022·0 cites·16 claims
- 1839US7663764B2Measuring device and method to optically measure an objectPOLYTEC GMBH·Filed 2007·Granted Feb 16, 2010·0 cites·20 claims
- 1937US12066321B2Method for determining the path of a measurement beam of an interferometric measuring device, and measuring device for interferometric measurement of an object under measurementPOLYTEC GMBH·Filed 2019·Granted Aug 20, 2024·0 cites·14 claims
- 2036US2021278271A1Method for determining the path of a measurement beam of an interferometric measuring device, and measuring device for interferometric measurement of an object under measurementPOLYTEC GMBH·Filed 2019·Application pending·0 cites
- 2135US2013094028A1Coherence grid -- interferometer and method for a spatially resolved optic measurement of the surface geometry of an objectPOLYTEC GMBH·Filed 2012·Application pending·0 cites
- 2232US10018460B2Interferometric measuring device with detectors set at different angular rangesPOLYTEC GMBH·Filed 2012·Granted Jul 10, 2018·0 cites·20 claims
- 2328US2011096325A1Method and device for the spectrometric measurement of a material flow moving in the longitudinal directionPOLYTEC GMBH·Filed 2010·Application pending·0 cites
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