Assignee
PRESIDENT OF KANAZAWA UNIVERSI
JP·3 granted patents·39 citations·filing 1990–2002
Top patents by PatentIndex Score
3 records- 0164US6734978B2Profile measuring method and measurement apparatus using interference of lightPRESIDENT OF KANAZAWA UNIVERSI·Filed 2002·Granted May 11, 2004·14 cites·15 claims
- 0247US5064779AMethod of manufacturing polycrystalline silicon filmPRESIDENT OF KANAZAWA UNIVERSI·Filed 1990·Granted Nov 12, 1991·25 cites·14 claims
- 0320US6251670B1Method of culturing cells in suspension using lectinsPRESIDENT OF KANAZAWA UNIVERSI·Filed 1999·Granted Jun 26, 2001·0 cites·8 claims
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