Assignee
PRESIDENT OF SAITAMA UNIVERSIT
JP·1 granted patent·1 pending application·8 citations·filing 2003–2003
Technology mixG01B2
Top patents by PatentIndex Score
2 records- 0142US6943870B2Deformation measuring method and apparatus using electronic speckle pattern interferometryPRESIDENT OF SAITAMA UNIVERSIT·Filed 2003·Granted Sep 13, 2005·8 cites·8 claims
- 0220US2004059526A1Deformation measuring method and apparatus using electronic speckle pattern interferometryPRESIDENT OF SAITAMA UNIVERSIT·Filed 2003·Application pending·0 cites
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