Assignee
PROBE TECHNOLOGY
US6 patents
Top patents by PatentIndex Score
US5720098AFeb 24, 1998
Method for making a probe preserving a uniform stress distribution under deflection
PROBE TECHNOLOGY169 citations99
US5764072AJun 9, 1998
Dual contact probe assembly for testing integrated circuits
PROBE TECHNOLOGY128 citations98
US5742174AApr 21, 1998
Membrane for holding a probe tip in proper location
PROBE TECHNOLOGY198 citations97
US5751157AMay 12, 1998
Method and apparatus for aligning probes
PROBE TECHNOLOGY58 citations96
US5884395AMar 23, 1999
Assembly structure for making integrated circuit chip probe cards
PROBE TECHNOLOGY76 citations94
US5644249AJul 1, 1997
Method and circuit testing apparatus for equalizing a contact force between probes and pads
PROBE TECHNOLOGY52 citations92